Michal Sír, Ivan Feno. Measurement Method for the Dynamic On-State Resistance of GaN Semiconductors. In 2nd European Conference on Electrical Engineering and Computer Science, EECS 2018, Bern, Switzerland, December 20-22, 2018. pages 543-546, IEEE, 2018. [doi]
@inproceedings{SirF18,
title = {Measurement Method for the Dynamic On-State Resistance of GaN Semiconductors},
author = {Michal Sír and Ivan Feno},
year = {2018},
doi = {10.1109/EECS.2018.00106},
url = {https://doi.org/10.1109/EECS.2018.00106},
researchr = {https://researchr.org/publication/SirF18},
cites = {0},
citedby = {0},
pages = {543-546},
booktitle = {2nd European Conference on Electrical Engineering and Computer Science, EECS 2018, Bern, Switzerland, December 20-22, 2018},
publisher = {IEEE},
isbn = {978-1-7281-1929-8},
}