Measurement Method for the Dynamic On-State Resistance of GaN Semiconductors

Michal Sír, Ivan Feno. Measurement Method for the Dynamic On-State Resistance of GaN Semiconductors. In 2nd European Conference on Electrical Engineering and Computer Science, EECS 2018, Bern, Switzerland, December 20-22, 2018. pages 543-546, IEEE, 2018. [doi]

Abstract

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