Subthreshold parameters of radio-frequency multi-finger nanometer MOS transistors

Sik-Lam Siu, Hei Wong, Wing-Shan Tam, K. Kakusima, H. Iwai. Subthreshold parameters of radio-frequency multi-finger nanometer MOS transistors. Microelectronics Reliability, 49(4):387-391, 2009. [doi]

Authors

Sik-Lam Siu

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Hei Wong

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Wing-Shan Tam

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K. Kakusima

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H. Iwai

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