Sik-Lam Siu, Hei Wong, Wing-Shan Tam, K. Kakusima, H. Iwai. Subthreshold parameters of radio-frequency multi-finger nanometer MOS transistors. Microelectronics Reliability, 49(4):387-391, 2009. [doi]
@article{SiuWTKI09,
title = {Subthreshold parameters of radio-frequency multi-finger nanometer MOS transistors},
author = {Sik-Lam Siu and Hei Wong and Wing-Shan Tam and K. Kakusima and H. Iwai},
year = {2009},
doi = {10.1016/j.microrel.2009.01.004},
url = {http://dx.doi.org/10.1016/j.microrel.2009.01.004},
researchr = {https://researchr.org/publication/SiuWTKI09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {4},
pages = {387-391},
}