Power transition X filling based selective Huffman encoding technique for test-data compression and Scan Power Reduction for SOCs

Lokesh Sivanandam, Sakthivel Periyasamy, Oorkavalan Umamaheswari. Power transition X filling based selective Huffman encoding technique for test-data compression and Scan Power Reduction for SOCs. Microprocessors and Microsystems, 72, 2020. [doi]

Abstract

Abstract is missing.