Mukund Sivaraman, Andrzej J. Strojwas. Path delay fault diagnosis and coverage-a metric and an estimationtechnique. IEEE Trans. on CAD of Integrated Circuits and Systems, 20(3):440-457, 2001. [doi]
@article{SivaramanS01,
title = {Path delay fault diagnosis and coverage-a metric and an estimationtechnique},
author = {Mukund Sivaraman and Andrzej J. Strojwas},
year = {2001},
doi = {10.1109/43.913761},
url = {http://doi.ieeecomputersociety.org/10.1109/43.913761},
tags = {coverage},
researchr = {https://researchr.org/publication/SivaramanS01},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {20},
number = {3},
pages = {440-457},
}