Mukund Sivaraman, Andrzej J. Strojwas. Path delay fault diagnosis and coverage-a metric and an estimationtechnique. IEEE Trans. on CAD of Integrated Circuits and Systems, 20(3):440-457, 2001. [doi]
@article{SivaramanS01, title = {Path delay fault diagnosis and coverage-a metric and an estimationtechnique}, author = {Mukund Sivaraman and Andrzej J. Strojwas}, year = {2001}, doi = {10.1109/43.913761}, url = {http://doi.ieeecomputersociety.org/10.1109/43.913761}, tags = {coverage}, researchr = {https://researchr.org/publication/SivaramanS01}, cites = {0}, citedby = {0}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, volume = {20}, number = {3}, pages = {440-457}, }