A hybrid prognostics approach for MEMS: From real measurements to remaining useful life estimation

Haithem Skima, Kamal Medjaher, Christophe Varnier, Eugen Dedu, Julien Bourgeois. A hybrid prognostics approach for MEMS: From real measurements to remaining useful life estimation. Microelectronics Reliability, 65:79-88, 2016. [doi]

Abstract

Abstract is missing.