Reliability analysis of hybrid spin transfer torque magnetic tunnel junction/CMOS majority voters

Mariem Slimani, Paulo F. Butzen, Lirida A. B. Naviner, Y. Wang, Hao Cai. Reliability analysis of hybrid spin transfer torque magnetic tunnel junction/CMOS majority voters. Microelectronics Reliability, 64:48-53, 2016. [doi]

Abstract

Abstract is missing.