Scalable automatic test data generation from modeling diagrams

Yannis Smaragdakis, Christoph Csallner, Ranjith Subramanian. Scalable automatic test data generation from modeling diagrams. In R. E. Kurt Stirewalt, Alexander Egyed, Bernd Fischer, editors, 22nd IEEE/ACM International Conference on Automated Software Engineering (ASE 2007), November 5-9, 2007, Atlanta, Georgia, USA. pages 4-13, ACM, 2007. [doi]

Abstract

Abstract is missing.