Ageing and Failure Modes of IGBT Modules in High-Temperature Power Cycling - researchr publication authors

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Vanessa Smet, François Forest, Jean-Jacques Huselstein, Frédéric Richardeau, Zoubir Khatir, Stéphane Lefebvre, Mounira Berkani. Ageing and Failure Modes of IGBT Modules in High-Temperature Power Cycling. IEEE Transactions on Industrial Electronics, 58(10):4931-4941, 2011. [doi]

This author has not been identified. Look up 'Vanessa Smet' in GoogleThis author has not been identified. Look up 'François Forest' in GoogleThis author has not been identified. Look up 'Jean-Jacques Huselstein' in GoogleThis author has not been identified. Look up 'Frédéric Richardeau' in GoogleThis author has not been identified. Look up 'Zoubir Khatir' in GoogleThis author has not been identified. Look up 'Stéphane Lefebvre' in GoogleThis author has not been identified. Look up 'Mounira Berkani' in Google

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