Vanessa Smet, François Forest, Jean-Jacques Huselstein, Frédéric Richardeau, Zoubir Khatir, Stéphane Lefebvre, Mounira Berkani. Ageing and Failure Modes of IGBT Modules in High-Temperature Power Cycling. IEEE Transactions on Industrial Electronics, 58(10):4931-4941, 2011. [doi]
@article{SmetFHRKLB11,
title = {Ageing and Failure Modes of IGBT Modules in High-Temperature Power Cycling},
author = {Vanessa Smet and François Forest and Jean-Jacques Huselstein and Frédéric Richardeau and Zoubir Khatir and Stéphane Lefebvre and Mounira Berkani},
year = {2011},
doi = {10.1109/TIE.2011.2114313},
url = {http://dx.doi.org/10.1109/TIE.2011.2114313},
researchr = {https://researchr.org/publication/SmetFHRKLB11},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Industrial Electronics},
volume = {58},
number = {10},
pages = {4931-4941},
}