Robert Smith 0001, Jebediah Rosen, Dan Ventura. Adapting Standard External Clustering Metrics for Repetitive, Noisy Observations. In M. Arif Wani, Taghi M. Khoshgoftaar, Dingding Wang 0001, Huanjing Wang, Naeem Seliya, editors, 18th IEEE International Conference On Machine Learning And Applications, ICMLA 2019, Boca Raton, FL, USA, December 16-19, 2019. pages 908-914, IEEE, 2019. [doi]
Abstract is missing.