A New Hardware Architecture for Digital In-Circuit Testing

Matt Snook, Bob Illick. A New Hardware Architecture for Digital In-Circuit Testing. In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 64-71, IEEE Computer Society, 1983.

@inproceedings{SnookI83,
  title = {A New Hardware Architecture for Digital In-Circuit Testing},
  author = {Matt Snook and Bob Illick},
  year = {1983},
  tags = {architecture, testing},
  researchr = {https://researchr.org/publication/SnookI83},
  cites = {0},
  citedby = {0},
  pages = {64-71},
  booktitle = {Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983},
  publisher = {IEEE Computer Society},
}