3DComplete: Efficient completeness inspection using a 2.5D color scanner

Edmond Wai Yan So, Matteo Munaro, Stefano Michieletto, Stefano Tonello, Emanuele Menegatti. 3DComplete: Efficient completeness inspection using a 2.5D color scanner. Computers in Industry, 64(9):1237-1252, 2013. [doi]

Authors

Edmond Wai Yan So

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Matteo Munaro

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Stefano Michieletto

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Stefano Tonello

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Emanuele Menegatti

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