Edmond Wai Yan So, Matteo Munaro, Stefano Michieletto, Stefano Tonello, Emanuele Menegatti. 3DComplete: Efficient completeness inspection using a 2.5D color scanner. Computers in Industry, 64(9):1237-1252, 2013. [doi]
@article{SoMMTM13,
title = {3DComplete: Efficient completeness inspection using a 2.5D color scanner},
author = {Edmond Wai Yan So and Matteo Munaro and Stefano Michieletto and Stefano Tonello and Emanuele Menegatti},
year = {2013},
doi = {10.1016/j.compind.2013.03.014},
url = {http://dx.doi.org/10.1016/j.compind.2013.03.014},
researchr = {https://researchr.org/publication/SoMMTM13},
cites = {0},
citedby = {0},
journal = {Computers in Industry},
volume = {64},
number = {9},
pages = {1237-1252},
}