Methodologies for Evaluating and Measuring Capacitance Mismatch in CMOS Integrated Circuits - researchr publication

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Carlos Fernando Teodósio Soares, Antonio Petraglia, Gustavo S. de Campos. Methodologies for Evaluating and Measuring Capacitance Mismatch in CMOS Integrated Circuits. IEEE Trans. on Circuits and Systems, 64-II(2):101-105, 2017. [doi]

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