João Luís Sobral. Leather Inspection Based on Wavelets. In Jorge S. Marques, Nicolas Pérez de la Blanca, Pedro Pina, editors, Pattern Recognition and Image Analysis, Second Iberian Conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005, Proceedings, Part II. Volume 3523 of Lecture Notes in Computer Science, pages 682-688, Springer, 2005. [doi]
Abstract is missing.