Jerry M. Soden, Charles F. Hawkins. Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 443-451, IEEE Computer Society, 1986.
@inproceedings{SodenH86,
title = {Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs},
author = {Jerry M. Soden and Charles F. Hawkins},
year = {1986},
tags = {reliability},
researchr = {https://researchr.org/publication/SodenH86},
cites = {0},
citedby = {0},
pages = {443-451},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986},
publisher = {IEEE Computer Society},
}