Jerry M. Soden - researchr alias

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Viewing Publication 1 - 26 from 26

2002

Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMsB. Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura. itc 2002: 947-953 [doi]

Parametric Failures in CMOS ICs - A Defect-Based AnalysisJaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins. itc 2002: 90-99 [doi]

2001

Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and ExperimentsIvan de Paúl, M. Rosales, B. Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden. vts 2001: 286-291 [doi]

1999

Deep Submicron CMOS Current IC Testing: Is There a Future?Charles F. Hawkins, Jerry M. Soden. dt, 16(4):14-15, 1999.

Test and Reliability: Partners in IC Manufacturing, Part 2Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin. dt, 16(4):66-73, 1999. [doi]

1998

CMOS IC reliability indicators and burn-in economicsAlan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell. itc 1998: 194-203 [doi]

1997

1996

High Resolution I::DDQ:: Characterization and Testing - Practical IssuesAlan W. Righter, Jerry M. Soden, Richard W. Beegle. itc 1996: 259-268

IC Failure Analysis Tools and Techniques - Macig, Mystery, and ScienceJerry M. Soden, Richard E. Anderson, Christopher L. Henderson. itc 1996: 935

IDDQ Testing: Issues Present and FutureJerry M. Soden, Charles F. Hawkins. dt, 13(4):61-65, 1996. [doi]

1995

IDDQ Design and Test Advantages Propel IndustryCharles F. Hawkins, Jerry M. Soden. dt, 12(2):40-41, 1995.

1994

Defect Classes - An Overdue Paradigm for CMOS ICCharles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson. itc 1994: 413-425

1993

Quality Testing Requires Quality ThinkingJerry M. Soden, Charles F. Hawkins. itc 1993: 596

IC failure analysis: techniques and tools for quality reliability improvementJerry M. Soden, Richard E. Anderson. pieee, 81(5):703-715, 1993. [doi]

1992

IDDQ testing: A reviewJerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao. et, 3(4):291-303, 1992. [doi]

1991

The Behavior and Testing Implications of CMOS IC Logic Gate Open CircuitsChristopher L. Henderson, Jerry M. Soden, Charles F. Hawkins. itc 1991: 302-310

1990

DDQ test setsRonald R. Fritzemeier, Jerry M. Soden, R. Keith Treece, Charles F. Hawkins. itc 1990: 427-435 [doi]

DDQJerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins. itc 1990: 255-256 [doi]

1989

CMOS IC Stuck-Open Fault Electrical Effects and Design ConsiderationsJerry M. Soden, R. Keith Treece, Michael R. Taylor, Charles F. Hawkins. itc 1989: 423-430

1986

Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICsJerry M. Soden, Charles F. Hawkins. itc 1986: 443-451

Test Considerations for Gate Oxide Shorts in CMOS ICsJerry M. Soden, Charles F. Hawkins. dt, 3(4):56-64, 1986. [doi]

1985

Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICsJerry M. Soden, Charles F. Hawkins. itc 1985: 544-557

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