The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits - researchr publication

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Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins. The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 302-310, IEEE Computer Society, 1991.

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