Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins. The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 302-310, IEEE Computer Society, 1991.
@inproceedings{HendersonSH91,
title = {The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits},
author = {Christopher L. Henderson and Jerry M. Soden and Charles F. Hawkins},
year = {1991},
tags = {testing, source-to-source, logic, open-source},
researchr = {https://researchr.org/publication/HendersonSH91},
cites = {0},
citedby = {0},
pages = {302-310},
booktitle = {Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
publisher = {IEEE Computer Society},
isbn = {0-8186-9156-5},
}