Ali Keshavarzi - researchr alias

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Viewing Publication 1 - 43 from 43

2024

Towards site-specific management of soil organic carbon: Comparing support vector machine and ordinary kriging approaches based on pedo-geomorphometric factorsSunshine A. De Caires, Ali Keshavarzi, Eduardo Leonel Bottega, Fuat Kaya. cea, 216:108545, January 2024. [doi]

2021

Dealing with soil organic carbon modeling: some insights from an agro-ecosystem in Northeast IranAli Keshavarzi, Henry Oppong Tuffour, Jimmy Clifford Oppong, Mojtaba Zeraatpisheh, Vinod Kumar. esi, 14(4):1833-1845, 2021. [doi]

2020

FerroElectronics for Edge IntelligenceAli Keshavarzi, Kai Ni 0004, Wilbert van den Hoek, Suman Datta, Arijit Raychowdhury. micro, 40(6):33-48, 2020. [doi]

2019

Edge Intelligence - On the Challenging Road to a Trillion Smart Connected IoT DevicesAli Keshavarzi, Wilbert van den Hoek. dt, 36(2):41-64, 2019. [doi]

Determining the best ISUM (Improved stock unearthing Method) sampling point number to model long-term soil transport and micro-topographical changes in vineyardsJesús Rodrigo-Comino, Ali Keshavarzi, Mojtaba Zeraatpisheh, Yeboah Gyasi-Agyei, Artemi Cerdà. cea, 159:147-156, 2019. [doi]

2017

Modeling soil cation exchange capacity using soil parameters: Assessing the heuristic modelsJalal Shiri, Ali Keshavarzi, Özgür Kisi, Ursula Iturrarán-Viveros, Ali Bagherzadeh, Rouhollah Mousavi, Sepideh Karimi. cea, 135:242-251, 2017. [doi]

Using soil easily measured parameters for estimating soil water capacity: Soft computing approachesJalal Shiri, Ali Keshavarzi, Özgür Kisi, Sepideh Karimi. cea, 141:327-339, 2017. [doi]

2014

Directions in future of SRAM with QDR-WideIO for high performance networking applications and beyondAli Keshavarzi, Dinesh Maheshwari, Derwin Mattos, Ravi Kapre, Sandeep Krishnegowda, Morgan Whately, Sudhir Gopalswamy. cicc 2014: 1-6 [doi]

2013

EP3: Empowering the killer SoC applications of 2020Shekhar Borkar, Uming Ko, Ali Keshavarzi, Ali Keshavarzi, Eugenio Cantatore. isscc 2013: 517 [doi]

2011

Developing Pedotransfer Functions for Estimating Field Capacity and Permanent Wilting Point Using Fuzzy Table Look-up SchemeAli Keshavarzi, Fereydoon Sarmadian, Reza Labbafi, Abbas Ahmadi. ccsecis, 4(1):130-141, 2011. [doi]

2009

2 GHz 2 Mb 2T Gain Cell Memory Macro With 128 GBytes/sec Bandwidth in a 65 nm Logic Process TechnologyDinesh Somasekhar, Yibin Ye, Paolo A. Aseron, Shih-Lien Lu, Muhammad M. Khellah, Jason Howard, Gregory Ruhl, Tanay Karnik, Shekhar Borkar, Vivek K. De, Ali Keshavarzi. jssc, 44(1):174-185, 2009. [doi]

2008

2GHz 2Mb 2T Gain-Cell Memory Macro with 128GB/s Bandwidth in a 65nm Logic ProcessDinesh Somasekhar, Yibin Ye, Paolo A. Aseron, Shih-Lien Lu, Muhammad M. Khellah, Jason Howard, Gregory Ruhl, Tanay Karnik, Shekhar Y. Borkar, Vivek De, Ali Keshavarzi. isscc 2008: 274-275 [doi]

2006

Impact of Thermal Gradients on Clock Skew and TestingSebastià A. Bota, José Luis Rosselló, Carol de Benito, Ali Keshavarzi, Jaume Segura. dt, 23(5):414-424, 2006. [doi]

2005

2004

2003

CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production TestingB. Alorda, B. Bloechel, Ali Keshavarzi, Jaume Segura. itc 2003: 719-726 [doi]

Parameter variations and impact on circuits and microarchitectureShekhar Borkar, Tanay Karnik, Siva Narendra, James Tschanz, Ali Keshavarzi, Vivek De. dac 2003: 338-342 [doi]

CMOS IC nanometer technology failure mechanismsCharles F. Hawkins, Ali Keshavarzi, Jaume Segura 0001. cicc 2003: 605-611 [doi]

A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to DetectCharles F. Hawkins, Ali Keshavarzi, Jaume Segura. dft 2003: 267 [doi]

Multiple-parameter CMOS IC testing with increased sensitivity for I::DDQ::Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Vivek De. tvlsi, 11(5):863-870, 2003. [doi]

Forward body bias for microprocessors in 130-nm technology generation and beyondSiva G. Narendra, Ali Keshavarzi, Bradley A. Bloechel, Shekhar Borkar, Vivek De. jssc, 38(5):696-701, 2003. [doi]

Burn-in Temperature Projections for Deep Sub-micron TechnologiesOleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins. itc 2003: 95-104 [doi]

Thermal Management of High Performance MicroprocessorsArman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi. dft 2003: 313-319 [doi]

2002

A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital CircuitsBhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi. itc 2002: 1130-1139 [doi]

IDDQ Testing for Deep-Submicron ICs: Challenges and SolutionsZhanping Chen, Liqiong Wei, Ali Keshavarzi, Kaushik Roy. dt, 19(2):24-33, 2002. [doi]

IDDQ Testing for Deep Submicron ICs: Challenges and SolutionsZhanping Chen, Liqiong Wei, Ali Keshavarzi, Kaushik Roy 0001. latw 2002: 186-192

Analysis of dual-V::T:: SRAM cells with full-swing single-ended bit line sensing for on-chip cacheFatih Hamzaoglu, Yibin Ye, Ali Keshavarzi, Kevin Zhang, Siva Narendra, Shekhar Borkar, Mircea R. Stan, Vivek De. tvlsi, 10(2):91-95, 2002. [doi]

Leakage and Process Variation Effects in Current Testing on Future CMOS CircuitsAli Keshavarzi, James Tschanz, Siva Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins. dt, 19(5):36-43, 2002. [doi]

Parametric Failures in CMOS ICs - A Defect-Based AnalysisJaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins. itc 2002: 90-99 [doi]

Challenges in Nanometric Technology Scaling: Trends and ProjectionsJaume Segura, Vivek De, Ali Keshavarzi. vts 2002: 447-448 [doi]

Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSIArman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi. dft 2002: 12-19 [doi]

2001

Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICsAli Keshavarzi, Sean Ma, Siva Narendra, B. Bloechel, K. Mistry, T. Ghani, Shekhar Borkar, Vivek De. islped 2001: 207-212 [doi]

Design and Test of Low Voltage CMOS CircuitsKaushik Roy, Ali Keshavarzi. isqed 2001: 7 [doi]

2000

Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQAli Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, K. Soumyanath, Vivek De. itc 2000: 1051-1059

Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutionsAli Keshavarzi, Kaushik Roy, Charles F. Hawkins. tvlsi, 8(6):717-723, 2000. [doi]

1999

Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC sAli Keshavarzi, Siva Narendra, Shekhar Borkar, Charles F. Hawkins, Kaushik Roy, Vivek De. islped 1999: 252-254 [doi]

1997

Intrinsic Leakage in Low-Power Deep Submicron CMOS ICsAli Keshavarzi, Kaushik Roy, Charles F. Hawkins. itc 1997: 146-155

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