Charles F. Hawkins, Ali Keshavarzi, Jaume Segura. A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 267, IEEE Computer Society, 2003. [doi]
Abstract is missing.