Test Methodologies in the Deep Submicron Era -- Analog, Mixed-Signal, and RF - researchr publication

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Abhijit Chatterjee, Ali Keshavarzi, Amit Patra, Siddhartha Mukhopadhyay. Test Methodologies in the Deep Submicron Era -- Analog, Mixed-Signal, and RF. In 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India. pages 12-13, IEEE Computer Society, 2005. [doi]

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