Abhijit Chatterjee, Ali Keshavarzi, Amit Patra, Siddhartha Mukhopadhyay. Test Methodologies in the Deep Submicron Era -- Analog, Mixed-Signal, and RF. In 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India. pages 12-13, IEEE Computer Society, 2005. [doi]
@inproceedings{ChatterjeeKPM05,
title = {Test Methodologies in the Deep Submicron Era -- Analog, Mixed-Signal, and RF},
author = {Abhijit Chatterjee and Ali Keshavarzi and Amit Patra and Siddhartha Mukhopadhyay},
year = {2005},
url = {http://csdl.computer.org/comp/proceedings/vlsid/2005/2264/00/22640012.pdf},
tags = {testing},
researchr = {https://researchr.org/publication/ChatterjeeKPM05},
cites = {0},
citedby = {0},
pages = {12-13},
booktitle = {18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2264-5},
}