B. Alorda, B. Bloechel, Ali Keshavarzi, Jaume Segura. CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 719-726, IEEE Computer Society, 2003. [doi]
Abstract is missing.