B. Alorda, B. Bloechel, Ali Keshavarzi, Jaume Segura. CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 719-726, IEEE Computer Society, 2003. [doi]
@inproceedings{AlordaBKS03,
title = {CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing},
author = {B. Alorda and B. Bloechel and Ali Keshavarzi and Jaume Segura},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630719abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/AlordaBKS03},
cites = {0},
citedby = {0},
pages = {719-726},
booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-8106-8},
}