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Defect Classes - An Overdue Paradigm for CMOS IC

Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson. Defect Classes - An Overdue Paradigm for CMOS IC. In Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. pages 413-425, IEEE Computer Society, 1994.

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