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CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations

Jerry M. Soden, R. Keith Treece, Michael R. Taylor, Charles F. Hawkins. CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. In Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. pages 423-430, IEEE Computer Society, 1989.

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