Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins. Transient Power Supply Voltage (V::DDT::) Analysis for Detecting IC Defects. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 23-31, IEEE Computer Society, 1997.
Abstract is missing.