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Transient Power Supply Voltage (V::DDT::) Analysis for Detecting IC Defects

Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins. Transient Power Supply Voltage (V::DDT::) Analysis for Detecting IC Defects. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 23-31, IEEE Computer Society, 1997.

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Edward I. Cole Jr.

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Jerry M. Soden

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Paiboon Tangyunyong

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Patrick L. Candelaria

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Richard W. Beegle

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Daniel L. Barton

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Christopher L. Henderson

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Charles F. Hawkins

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