Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins. Transient Power Supply Voltage (V::DDT::) Analysis for Detecting IC Defects. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 23-31, IEEE Computer Society, 1997.
@inproceedings{ColeSTCBBHH97,
title = {Transient Power Supply Voltage (V::DDT::) Analysis for Detecting IC Defects},
author = {Edward I. Cole Jr. and Jerry M. Soden and Paiboon Tangyunyong and Patrick L. Candelaria and Richard W. Beegle and Daniel L. Barton and Christopher L. Henderson and Charles F. Hawkins},
year = {1997},
tags = {analysis},
researchr = {https://researchr.org/publication/ColeSTCBBHH97},
cites = {0},
citedby = {0},
pages = {23-31},
booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-7803-4209-7},
}