A robust digital DC-DC converter with rail-to-rail output range in 40nm CMOS - researchr publication authors

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Eric G. Soenen, Alan Roth, Justin Shi, Martin Kinyua, Justin Gaither, Elizabeth Ortynska. A robust digital DC-DC converter with rail-to-rail output range in 40nm CMOS. In IEEE International Solid-State Circuits Conference, ISSCC 2010, Digest of Technical Papers, San Francisco, CA, USA, 7-11 February, 2010. pages 198-199, IEEE, 2010. [doi]

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