Eric G. Soenen, Alan Roth, Justin Shi, Martin Kinyua, Justin Gaither, Elizabeth Ortynska. A robust digital DC-DC converter with rail-to-rail output range in 40nm CMOS. In IEEE International Solid-State Circuits Conference, ISSCC 2010, Digest of Technical Papers, San Francisco, CA, USA, 7-11 February, 2010. pages 198-199, IEEE, 2010. [doi]
@inproceedings{SoenenRSKGO10,
title = {A robust digital DC-DC converter with rail-to-rail output range in 40nm CMOS},
author = {Eric G. Soenen and Alan Roth and Justin Shi and Martin Kinyua and Justin Gaither and Elizabeth Ortynska},
year = {2010},
doi = {10.1109/ISSCC.2010.5433987},
url = {http://dx.doi.org/10.1109/ISSCC.2010.5433987},
researchr = {https://researchr.org/publication/SoenenRSKGO10},
cites = {0},
citedby = {0},
pages = {198-199},
booktitle = {IEEE International Solid-State Circuits Conference, ISSCC 2010, Digest of Technical Papers, San Francisco, CA, USA, 7-11 February, 2010},
publisher = {IEEE},
isbn = {978-1-4244-6033-5},
}