Improved Deep Metric Learning with Multi-class N-pair Loss Objective

Kihyuk Sohn. Improved Deep Metric Learning with Multi-class N-pair Loss Objective. In Daniel D. Lee, Masashi Sugiyama, Ulrike V. Luxburg, Isabelle Guyon, Roman Garnett, editors, Advances in Neural Information Processing Systems 29: Annual Conference on Neural Information Processing Systems 2016, December 5-10, 2016, Barcelona, Spain. pages 1849-1857, 2016. [doi]

Abstract

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