Jeongju Sohn, Yasutaka Kamei, Shane McIntosh, Shin Yoo. Leveraging Fault Localisation to Enhance Defect Prediction. In 28th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2021, Honolulu, HI, USA, March 9-12, 2021. pages 284-294, IEEE, 2021. [doi]
Abstract is missing.