Jeongju Sohn, Shin Yoo. FLUCCS: using code and change metrics to improve fault localization. In Tevfik Bultan, Koushik Sen, editors, Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis, Santa Barbara, CA, USA, July 10 - 14, 2017. pages 273-283, ACM, 2017. [doi]
@inproceedings{SohnY17,
title = {FLUCCS: using code and change metrics to improve fault localization},
author = {Jeongju Sohn and Shin Yoo},
year = {2017},
doi = {10.1145/3092703.3092717},
url = {http://doi.acm.org/10.1145/3092703.3092717},
researchr = {https://researchr.org/publication/SohnY17},
cites = {0},
citedby = {0},
pages = {273-283},
booktitle = {Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis, Santa Barbara, CA, USA, July 10 - 14, 2017},
editor = {Tevfik Bultan and Koushik Sen},
publisher = {ACM},
isbn = {978-1-4503-5076-1},
}