Jeongju Sohn, Shin Yoo. FLUCCS: using code and change metrics to improve fault localization. In Tevfik Bultan, Koushik Sen, editors, Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis, Santa Barbara, CA, USA, July 10 - 14, 2017. pages 273-283, ACM, 2017. [doi]
Abstract is missing.