Igor Sokolov, Yuri Stepchenkov, Yuri Diachenko, Yuri Rogdestvenski, Denis Diachenko. Increasing Self-Timed Circuit Soft Error Tolerance. In IEEE East-West Design & Test Symposium, EWDTS 2020, Varna, Bulgaria, September 4-7, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.