Dual approach for bipolar transistor thermal impedance determination

R. Sommet, A. Xiong, A. A. L. de Souza, R. Quere. Dual approach for bipolar transistor thermal impedance determination. Microelectronics Journal, 41(9):554-559, 2010. [doi]

@article{SommetXSQ10,
  title = {Dual approach for bipolar transistor thermal impedance determination},
  author = {R. Sommet and A. Xiong and A. A. L. de Souza and R. Quere},
  year = {2010},
  doi = {10.1016/j.mejo.2010.04.008},
  url = {http://dx.doi.org/10.1016/j.mejo.2010.04.008},
  tags = {systematic-approach},
  researchr = {https://researchr.org/publication/SommetXSQ10},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Journal},
  volume = {41},
  number = {9},
  pages = {554-559},
}