Younghwan Son, Yoon Kim, Myounggon Kang. Characterization of oxide trap density with the charge pumping technique in dual-layer gate oxide. IEICE Electronic Express, 14(8):20170141, 2017. [doi]
@article{SonKK17a,
title = {Characterization of oxide trap density with the charge pumping technique in dual-layer gate oxide},
author = {Younghwan Son and Yoon Kim and Myounggon Kang},
year = {2017},
doi = {10.1587/elex.14.20170141},
url = {https://doi.org/10.1587/elex.14.20170141},
researchr = {https://researchr.org/publication/SonKK17a},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {14},
number = {8},
pages = {20170141},
}