On-chip jitter tolerance measurement technique for CDR circuits

Kyung-Sub Son, Kyongsu Lee, Jin-Ku Kang. On-chip jitter tolerance measurement technique for CDR circuits. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 1602-1605, IEEE, 2015. [doi]

Authors

Kyung-Sub Son

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Kyongsu Lee

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Jin-Ku Kang

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