VLSI reliability: Contributions from a three year national research program

Giovanni Soncini, Claudio Canali, Enrico Zanoni, Francrsco Cors, Alessandro Diligenti, Fausto Fantini, Vito A. Monaco, Guido Masetti, Carlo Morandi. VLSI reliability: Contributions from a three year national research program. European Transactions on Telecommunications, 1(2):209-220, 1990. [doi]

Abstract

Abstract is missing.