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Morphological Blob-Mura Defect Detection Method for TFT-LCD Panel Inspection

Young-Chul Song, Doo-Hyun Choi, Kil-Houm Park. Morphological Blob-Mura Defect Detection Method for TFT-LCD Panel Inspection. In Mircea Gh. Negoita, Robert J. Howlett, Lakhmi C. Jain, editors, Knowledge-Based Intelligent Information and Engineering Systems, 8th International Conference, KES 2004, Wellington, New Zealand, September 20-25, 2004. Proceedings. Part III. Volume 3215 of Lecture Notes in Computer Science, pages 862-868, Springer, 2004. [doi]

Authors

Young-Chul Song

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Doo-Hyun Choi

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Kil-Houm Park

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