Young-Chul Song, Doo-Hyun Choi, Kil-Houm Park. Morphological Blob-Mura Defect Detection Method for TFT-LCD Panel Inspection. In Mircea Gh. Negoita, Robert J. Howlett, Lakhmi C. Jain, editors, Knowledge-Based Intelligent Information and Engineering Systems, 8th International Conference, KES 2004, Wellington, New Zealand, September 20-25, 2004. Proceedings. Part III. Volume 3215 of Lecture Notes in Computer Science, pages 862-868, Springer, 2004. [doi]
@inproceedings{SongCP04, title = {Morphological Blob-Mura Defect Detection Method for TFT-LCD Panel Inspection}, author = {Young-Chul Song and Doo-Hyun Choi and Kil-Houm Park}, year = {2004}, url = {http://springerlink.metapress.com/openurl.asp?genre=article&issn=0302-9743&volume=3215&spage=862}, researchr = {https://researchr.org/publication/SongCP04}, cites = {0}, citedby = {0}, pages = {862-868}, booktitle = {Knowledge-Based Intelligent Information and Engineering Systems, 8th International Conference, KES 2004, Wellington, New Zealand, September 20-25, 2004. Proceedings. Part III}, editor = {Mircea Gh. Negoita and Robert J. Howlett and Lakhmi C. Jain}, volume = {3215}, series = {Lecture Notes in Computer Science}, publisher = {Springer}, isbn = {3-540-23205-2}, }