Tai Song, Zhengfeng Huang, Xiaohui Guo, Krstic Milos. Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation. J. Electronic Testing, 39(2):189-205, April 2023. [doi]
@article{SongHGM23,
title = {Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation},
author = {Tai Song and Zhengfeng Huang and Xiaohui Guo and Krstic Milos},
year = {2023},
month = {April},
doi = {10.1007/s10836-023-06057-8},
url = {https://doi.org/10.1007/s10836-023-06057-8},
researchr = {https://researchr.org/publication/SongHGM23},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {39},
number = {2},
pages = {189-205},
}