A Novel Defect Inspection Method for the TFT-LCD Image Based on Human Visual System

Tae-Eun Song, Se-Yun Kim, Jong-Hwan Kim, Kil-Houm Park. A Novel Defect Inspection Method for the TFT-LCD Image Based on Human Visual System. In Hamid R. Arabnia, editor, Proceedings of the 2008 International Conference on Image Processing, Computer Vision, & Pattern Recognition, IPCV 2008, July 14-17, 2008, Las Vegas Nevada, USA, 2 Volumes. pages 335-341, CSREA Press, 2008.

Abstract

Abstract is missing.