Yong-Ha Song, Choong-Kyun Kim, Moo-Young Park, Bum-Suk Kye, Jeongil Seo, Dong-Soo Cho, Taek-Soo Kim, Gab-soo Han. A study of an abnormal ESD failure mechanism and threshold voltage caused by ESD current zapping sequence. Microelectronics Reliability, 44(9-11):1829-1834, 2004. [doi]
Abstract is missing.