Warin Sootkaneung, Sasithorn Chookaew, Suppachai Howimanporn. Combined Impact of BTI and Temperature Effect Inversion on Circuit Performance. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 310-315, IEEE Computer Society, 2016. [doi]
Abstract is missing.