Neelam Soundarajan, Jason O. Hallstrom, Adem Delibas, Guoqiang Shu. Testing Patterns. In 31st Annual IEEE / NASA Software Engineering Workshop (SEW-31 2007), 6-8 March 2007, Loyola College, Columbia, MD, USA. pages 109-120, IEEE Computer Society, 2007. [doi]
Abstract is missing.